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Vitrek V70 5KVAC Hipot Tester Programmable RS232~USB
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31 Okt 2019
United States
1 unit
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Spesifikasi

Vitrek V70 5KVAC Hipot Tester Programmable RS232~USB

  • 5KV AC Hipot Tester Programmable RS232~USB
  • 4.3" Color Touch Display-Easy To Use Intuitive User Interface
  • Made in the USA-Designed and Built in San Diego CA
  •  Compact, Lightweight, Rugged, Fan Free, Fast (100mS min test time) and Accurate
  • 5KV AC Hipot, 20mA max source current
  • 100 nano-Amp Leakage Current Resolution
  • Low Cost of Ownership-Two Year Calibration Interval
  • USB 2.0, Serial/RS232, Digital I/O Interfaces are Standard
  • Test Memory Stores up to 999 Steps and 60 Test Sequences
  • Internal Self Test Fully Exercises Output and Verifies Current Accuracy
  • Pre-Programmed Daily Verification Test With Optional PVD Test Load
  • 150µS Safety Shutdown
  • Ramped Discharge Capability
  • Selectable ARC Detection 1-20mA
  • Meets UL, CSA, IEC Safety Tester Requirements

 

Specification

ACW Test Steps
Voltage10 to 5000Vrms (1V resolution) sinewave at 50 or 60Hz +/- 0.05%
Model V75: 10 to 2000Vrms (1V resolution) sinewave at 50 or 60Hz +/- 0.05%
1%+5V accuracy under all allowed loading conditions
Max. Load20mArms (10mArms max resistive for >10sec), reduced by 20µA per V below 1000V, reduced by 10µA per V above 4000V
Leakage AccuracyDC coupled, true RMS, 10Hz-4KHz 3dB bandwidth
DUT isolated (<1.1mA) : 1%+5µA (1µA resolution) DUT isolated (>1.1mA) : 1%+30µA (10µA resolution)
DUT grounded : 1%+30µA+(4µA per KV) (10µA resolution)
ARC LimitDisabled or up to 30mA (1mA resolution)
Ramp0 to 99.9sec (0.02sec resolution)
Dwell0.1 to 9999sec (0.1sec resolution) or user terminated
ShutdownExcessive HV terminal current : within 1ms
User Stop : within 2ms
Interlock opened (if enabled) : within 2ms
Load Breakdown (sudden uncontrolled increase of load current): within 150µs
Leakage Limit (if enabled) : within 100ms
ARC Limit (if enabled) : within 1ms
User SettingsVoltage Level
Frequency
DUT Isolated/Grounded
Min. Leakage Limit (can be disabled)
Max. Leakage Limit (can be disabled)
ARC Limit (can be disabled)
Ramp Period
Dwell Period
Ramp Down Fast/As Ramp
Stop/Continue Sequence on Failure
DCW Test Steps
Voltage20 to 5000VDC (1V resolution)
Model V75: 20 to 3000VDC (1V resolution)
1%+5V accuracy under all allowed loading conditions
Max. Load2000-3000V : 7mA (reduce by 4µA per volt above 2000V), <0.1µF capacitance
3000-4000V : 3mA (reduce by 1µA per volt above 3000V), <0.05µF capacitance >4000V : 2mA (reduce by 0.5µA per volt above 4000V), <0.03µF capacitance
Leakage AccuracyDUT resistive, isolated (<200µA) : 1%+1µA (0.1µA resolution)
DUT resistive, isolated (0.2-1.5mA) : 1%+2µA (1µA resolution)
Otherwise : 1%+20µA (10µA resolution)
ARC LimitDisabled or up to 30mA (1mA resolution)
RampDUT resistive : 0.1 to 99.9sec (0.02sec resolution)
DUT capacitive : 1.0 to 99.9sec (0.02sec resolution)
Dwell0.1 to 9999sec (0.02sec resolution) or user terminated
Ramp Down0sec or as defined for ramp
Discharge Internal50KΩ discharge load and 0.03µF capacitive energy
ShutdownExcessive HV terminal current : within 1ms
User Stop : within 2ms
Interlock opened (if enabled) : within 2ms
Load Breakdown (sudden uncontrolled increase of load current): within 150µs
Leakage Limit (if enabled)within 100ms
ARC Limit (if enabled) : within 1ms
User SettingsVoltage Level
DUT Isolated/Grounded
DUT Resistive/Capacitive
Min. Leakage Limit (can be disabled)
Max. Leakage Limit (can be disabled)
ARC Limit (can be disabled)
Ramp Period
Dwell Period
Ramp Down Fast/As Ramp
Stop/Continue Sequence on Failure
IR Test Steps
Voltage20 to 5000VDC (1V resolution)

Model V75: 20 to 3000VDC (1V resolution)
2.5%+5V accuracy under all allowed loading conditions
Lowest IR3000V : 10MΩ
Highest IRDUT resistive, isolated : 90MΩ per V
DUT capacitive, isolated : 2MΩ per V
DUT grounded : 0.1MΩ per V
Max Capacitance3000V : 0.03µF
5mA maximum charging current
IR Accuracy<5% of Highest IR: 2% (0.1% resolution) 5-15% of Highest IR: 5% (1% resolution) 15-30% of Highest IR: 10% (1% resolution) >30% of Highest IR: 20% (1% resolution)
Test Time0.1 to 9999sec (0.1sec resolution) or user terminated
Test Delay0.0 to 9999sec (0.1sec resolution)
DischargeInternal 50KΩ discharge load and 0.03µF capacitive energy
ShutdownExcessive HV terminal current : within 1ms
User Stop : within 2ms
Interlock opened (if enabled) : within 2ms
Load Breakdown (sudden uncontrolled increase of load current): within 150µs
IR Limit (if enabled) : within 100ms
ARC Limit (if enabled) : within 1ms
User SettingsVoltage Level
DUT Isolated/Grounded
DUT Resistive/Capacitive
Min. IR Limit
Max. IR Limit (can be disabled)
Ramp Period
Dwell Period
Delay Period
Dwell End On Pass/Fail/Time/Steady or Rising
Ramp Down Fast/As Ramp
Stop/Continue Sequence on Failure
CONT Test Steps
Method2 terminal measurement (DC)
Test Current<10.5mA
Test Voltage<4.15V
Range0Ω to 60KΩ
Accuracy<0.75Ω : 1.5% + 0.015Ω (0.001Ω resolution)
<13Ω : 1.5%+0.02Ω (0.01Ω resolution) 13-1000Ω : 3%+1Ω (1Ω resolution) 1K-4KΩ : 4% (10Ω resolution) 4K-13KΩ : 5% (100Ω resolution) >13KΩ : 10% (1KΩ resolution)
Test Time0.06 to 9999sec (0.02sec resolution) or user terminated
CONT LeakageDCW or IR test steps : <0.1µA
ACW test steps : <2.5µA per KV setting (DUT isolated), <5µA (DUT grounded)
User SettingsMin. Limit (can be disabled)
Max. Limit (can be disabled)
Resistance Offset
Test Time
Stop/Continue Sequence on Failure
GB Test Steps
Method4 terminal measurement (AC)
Current1 to 30Arms (0.01A resolution) sinewave at 50 or 60Hz +/- 0.05%
3%+10mA accuracy
Compliance>4.5Vrms at all currents
Open Circuit<10Vpk
DUT GroundDUT may be isolated from ground or be grounded. If grounded, must be within 3Vpk of V7X ground.
RangeMax resistance determined by max compliance and test current
Accuracy6.5A : 2.5%+1mΩ (0.1mΩ resolution)
Test Time≤20A : 0.1 to 9999sec (0.02sec resolution) or user terminated
>20-25A : 0.1 to 180sec (0.02sec resolution) or user terminated
>25A : 0.1 to 120sec (0.02sec resolution) or user terminated (50% max duty cycle)
GB LeakageDCW or IR test steps : <1µA
ACW test steps : <5µA per KV setting (DUT isolated), <10µA (DUT grounded)
User SettingsCurrent Level
Frequency
Min. Limit (can be disabled)
Max. Limit
Resistance Offset
Test Time
Stop/Continue Sequence on Failure
PAUSE Test Steps
Pause Delay0.1 to 9999sec (0.02sec resolution)
User SettingsPause Delay
HOLD Test Steps
Timeout0.1 to 9999sec (0.02sec resolution) or none
User SettingsTimeout (can be disabled)
Message (two lines)
SWITCH Test Steps
Execution Time<0.05sec per switch (Model V75)
<0.04sec per Switch unit + switch unit switching time (see 964 specifications) (All other models)
User SettingsSub Type (Model V75)
Relay states for each relay in the specified Sub Type (Model V75)
Relay states for each relay in each switch unit (4 max switch units) (All other models)
Dimensional137mmH x 248mmW x 284mmD (5.4″ x 9.75″ x 11.2″)
V70, 71, 73, 75, and 79: 6.8kg (15lb) net, 7.9kg (17.5lb) shipping
V74: 7.9kg (17.5lb) net, 9.1kg (20lb) shipping
Dimensions and weights shown are nominal
Environmental
Storage Environment-20 to 75C (non-condensing)
Operating Environment0 to 40C, <85% RH (non-condensing), Pollution Degree 2
Operating Altitude0 to 10000ft ASL, reduced maximum voltage capability above 5000ft
Power SourceInternally set for 105-125Vrms or 210-250Vrms, 45-65Hz, 200VA maximum

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