VITREK

Vitrek PA900 - Harmonic Power Analyzer (Mainframe Only, Input Cards Sold Separately)Mainframe only - does not include input cardsMost advanced power measurement platform with an unprecedented range of capabilitiesHighest precision with industry leading noise floorUp to 500 harmonics at 400Hz - meets Airbus avionics power measurement criteriaLarge, high resolution color displayModular design enables up to 4 power measurement channel cardsAll channel cards are available with one of 3 current input optionsBuilt in data logger with intervals from 10mS to 100 hours with optional time/date stampFront panel USB interface  Voltage Input Specifications  S or A ChannelW ChannelSpecified Input RangeDC0 to ±1000V0 to ±700VAC0.1 to 1000Vrms0.1 to 700VrmsPeak<1800V<1800VSafe Input Range<1ms2500Vrms (<3000Vpk)2000Vrms (<3000Vpk)<100ms2000Vrms (<3000Vpk)1500Vrms (<3000Vpk)<5s1500Vrms (<2500Vpk)1000Vrms (<2500Vpk)Cont1000Vrms (<1800Vpk)700Vrms (<1800Vpk)Impedance 1.2MΩ ± 1%400KΩ ± 1% Voltage Accuracy Specifications S ChannelA ChannelW ChannelResolution0.001V0.1mV0.001VBase Accuracy0.1%rdg0.03%rdg0.1%rdgFrequency Adder0.01-­‐1Hz: 0.05%rdg<10KHz: (0.005*F)%rdg10-­‐40KHz: (0.05+(0.012*(F-­‐10)))%rdg40-­‐100KHz: (0.41+(0.025*(F-­‐40)))%rdg0.01-­‐1Hz: 0.1%rdg<40KHz: (0.002*F)%rdg40-­‐100KHz: (0.08+(0.004*(F-­‐40)))%rdg100-­‐1000KHz: (0.32+(0.013*(F-­‐100)))%rdgBandwidth (-­‐3dB)>700KHz>2.5MHzFloor AdderDC: 0.00 2VAC<100Hz: 0.003VAC>100Hz: 0.005VDC: 0.00 1VAC<100Hz: 0.002VAC>100Hz: 0.005VDC: 0.00 3VAC<100Hz: 0.00 4VAC>100Hz: 0.007VSelf-Heating Adder0.0005ppm rdg per Vrms 20.0015ppm rdg per Vrms 2Single Harmonic Adder<10KHz: 0.01%fund + 0.001V<85KHz: 0.05%fund + 0.005V<10KHz: 0.005%fund + 0.00 05V<85KHz: 0.05%fund + 0.005V<10KHz: 0.015%fund + 0.0015V<100KHz: 0.03%fund + 0.005V<310KHz: 0.08%fund + 0.01VΣHarmonic Adder<10KHz: 0.02%fund + 0.002V<85KHz: 0.1%fund + 0.01V<10KHz: 0.015%fund + 0.001V<85KHz: 0.15%fund + 0.01V<10KHz: 0.03%fund + 0.003V<100KHz: 0.06%fund + 0.007V<310KHz: 0.15%fund + 0.015VCMRR1uV per V.Hz0.7uV per V.HzInter-Channel Phase(0.02° + 0.15°*F)(0.02° + 0.07°*F)Multimeter

Vitrek 983i - 11KV Teraohmmeter / Insulation Resistance Tester98x series teraohmmeter / insulation resistance tester11 KV DC output voltageMeets today's demanding requirements for higher voltage IR testingIdeal for higher voltage IR requirements, such as electric vehicle systems and higher voltage solar arraysBased on Vitrek's proven DSP technologyCan directly control up to four 64 channel HV scanners, right out of the boxHas a unique combination of performance features - multi dwell functionality, high speed testing, pico-amp leakage measurement, continuously variable IR test voltageGeneral SpecificationsSpecificationsValid after 15 minute warm-up, for 1 year from last external calibration, and for ambient temperature within +/- 2 Degrees C of last performed ZERO operation.EthernetHigh speed, high noise immunity LAN interfaceRS232 InterfaceSelectable baud: 9600, 19200, 38400, 57600 or 115200, full handshakeVICL InterfacesProvided for control of HV ScannersDigital I/O InterfaceProvides 4 digital inputs and 5 digital outputs. Functions include, Start/Stop, Testing, Pass/Fail, HV Present, Safety Interlock, Dwell TimerOptional GPIBOption GPIB-9 adds GPIB interface capabilityOperating Temperature0°C to 50°CHumidity<85% RH (non-condensing)Power105-265Vrms, 45-65Hz, 500VA MaxDimensions89mm H x 432mm W x 457mm D (3.5" H x 17" W x 18" D)Weight5Kg (11 lb.) Net / 7Kg (15 lb.)AccessoriesAlligator test leads, NIST traceable calibration certificate with no data, power cord and operator's manual. Limited ISO 17025 cal cert with data & uncertainties available.DC Output VoltageOutput60V to 11000VAccuracy+/- (0.25% rdg + 0.2V)Resolution1VLoadingup to 4mA charging, 2mA continuousCurrent measurementRETURN current only, 1pA to 4mAAccuracy (Resistive Load up to 1000pF)+/- (0.5%rdg + 10pA + 2pA per kV))Accuracy (Capacitive Load 1000pF to 50nF)+/- (0.5%rdg + 100pA + 20pA per kV))Accuracy (Capacitive Load >50nF)+/- (0.5%rdg + 1nA + 200pA per kV))TimingCharge Time1 second minimum charge time, 9999 sec max.Dwell Time0.1s to 9999 days, 0.1 sec resolutionMultimeter

Vitrek V70 5KVAC Hipot Tester Programmable RS232~USB5KV AC Hipot Tester Programmable RS232~USB4.3" Color Touch Display-Easy To Use Intuitive User InterfaceMade in the USA-Designed and Built in San Diego CA Compact, Lightweight, Rugged, Fan Free, Fast (100mS min test time) and Accurate5KV AC Hipot, 20mA max source current100 nano-Amp Leakage Current ResolutionLow Cost of Ownership-Two Year Calibration IntervalUSB 2.0, Serial/RS232, Digital I/O Interfaces are StandardTest Memory Stores up to 999 Steps and 60 Test SequencesInternal Self Test Fully Exercises Output and Verifies Current AccuracyPre-Programmed Daily Verification Test With Optional PVD Test Load150µS Safety ShutdownRamped Discharge CapabilitySelectable ARC Detection 1-20mAMeets UL, CSA, IEC Safety Tester Requirements SpecificationACW Test StepsVoltage10 to 5000Vrms (1V resolution) sinewave at 50 or 60Hz +/- 0.05%Model V75: 10 to 2000Vrms (1V resolution) sinewave at 50 or 60Hz +/- 0.05%1%+5V accuracy under all allowed loading conditionsMax. Load20mArms (10mArms max resistive for >10sec), reduced by 20µA per V below 1000V, reduced by 10µA per V above 4000VLeakage AccuracyDC coupled, true RMS, 10Hz-4KHz 3dB bandwidthDUT isolated (<1.1mA) : 1%+5µA (1µA resolution) DUT isolated (>1.1mA) : 1%+30µA (10µA resolution)DUT grounded : 1%+30µA+(4µA per KV) (10µA resolution)ARC LimitDisabled or up to 30mA (1mA resolution)Ramp0 to 99.9sec (0.02sec resolution)Dwell0.1 to 9999sec (0.1sec resolution) or user terminatedShutdownExcessive HV terminal current : within 1msUser Stop : within 2msInterlock opened (if enabled) : within 2msLoad Breakdown (sudden uncontrolled increase of load current): within 150µsLeakage Limit (if enabled) : within 100msARC Limit (if enabled) : within 1msUser SettingsVoltage LevelFrequencyDUT Isolated/GroundedMin. Leakage Limit (can be disabled)Max. Leakage Limit (can be disabled)ARC Limit (can be disabled)Ramp PeriodDwell PeriodRamp Down Fast/As RampStop/Continue Sequence on FailureDCW Test StepsVoltage20 to 5000VDC (1V resolution)Model V75: 20 to 3000VDC (1V resolution)1%+5V accuracy under all allowed loading conditionsMax. Load2000-3000V : 7mA (reduce by 4µA per volt above 2000V), <0.1µF capacitance3000-4000V : 3mA (reduce by 1µA per volt above 3000V), <0.05µF capacitance >4000V : 2mA (reduce by 0.5µA per volt above 4000V), <0.03µF capacitanceLeakage AccuracyDUT resistive, isolated (<200µA) : 1%+1µA (0.1µA resolution)DUT resistive, isolated (0.2-1.5mA) : 1%+2µA (1µA resolution)Otherwise : 1%+20µA (10µA resolution)ARC LimitDisabled or up to 30mA (1mA resolution)RampDUT resistive : 0.1 to 99.9sec (0.02sec resolution)DUT capacitive : 1.0 to 99.9sec (0.02sec resolution)Dwell0.1 to 9999sec (0.02sec resolution) or user terminatedRamp Down0sec or as defined for rampDischarge Internal50KΩ discharge load and 0.03µF capacitive energyShutdownExcessive HV terminal current : within 1msUser Stop : within 2msInterlock opened (if enabled) : within 2msLoad Breakdown (sudden uncontrolled increase of load current): within 150µsLeakage Limit (if enabled)within 100msARC Limit (if enabled) : within 1msUser SettingsVoltage LevelDUT Isolated/GroundedDUT Resistive/CapacitiveMin. Leakage Limit (can be disabled)Max. Leakage Limit (can be disabled)ARC Limit (can be disabled)Ramp PeriodDwell PeriodRamp Down Fast/As RampStop/Continue Sequence on FailureIR Test StepsVoltage20 to 5000VDC (1V resolution)Model V75: 20 to 3000VDC (1V resolution)2.5%+5V accuracy under all allowed loading conditionsLowest IR3000V : 10MΩHighest IRDUT resistive, isolated : 90MΩ per VDUT capacitive, isolated : 2MΩ per VDUT grounded : 0.1MΩ per VMax Capacitance3000V : 0.03µF5mA maximum charging currentIR Accuracy<5% of Highest IR: 2% (0.1% resolution) 5-15% of Highest IR: 5% (1% resolution) 15-30% of Highest IR: 10% (1% resolution) >30% of Highest IR: 20% (1% resolution)Test Time0.1 to 9999sec (0.1sec resolution) or user terminatedTest Delay0.0 to 9999sec (0.1sec resolution)DischargeInternal 50KΩ discharge load and 0.03µF capacitive energyShutdownExcessive HV terminal current : within 1msUser Stop : within 2msInterlock opened (if enabled) : within 2msLoad Breakdown (sudden uncontrolled increase of load current): within 150µsIR Limit (if enabled) : within 100msARC Limit (if enabled) : within 1msUser SettingsVoltage LevelDUT Isolated/GroundedDUT Resistive/CapacitiveMin. IR LimitMax. IR Limit (can be disabled)Ramp PeriodDwell PeriodDelay PeriodDwell End On Pass/Fail/Time/Steady or RisingRamp Down Fast/As RampStop/Continue Sequence on FailureCONT Test StepsMethod2 terminal measurement (DC)Test Current<10.5mATest Voltage<4.15VRange0Ω to 60KΩAccuracy<0.75Ω : 1.5% + 0.015Ω (0.001Ω resolution)<13Ω : 1.5%+0.02Ω (0.01Ω resolution) 13-1000Ω : 3%+1Ω (1Ω resolution) 1K-4KΩ : 4% (10Ω resolution) 4K-13KΩ : 5% (100Ω resolution) >13KΩ : 10% (1KΩ resolution)Test Time0.06 to 9999sec (0.02sec resolution) or user terminatedCONT LeakageDCW or IR test steps : <0.1µAACW test steps : <2.5µA per KV setting (DUT isolated), <5µA (DUT grounded)User SettingsMin. Limit (can be disabled)Max. Limit (can be disabled)Resistance OffsetTest TimeStop/Continue Sequence on FailureGB Test StepsMethod4 terminal measurement (AC)Current1 to 30Arms (0.01A resolution) sinewave at 50 or 60Hz +/- 0.05%3%+10mA accuracyCompliance>4.5Vrms at all currentsOpen Circuit<10VpkDUT GroundDUT may be isolated from ground or be grounded. If grounded, must be within 3Vpk of V7X ground.RangeMax resistance determined by max compliance and test currentAccuracy6.5A : 2.5%+1mΩ (0.1mΩ resolution)Test Time≤20A : 0.1 to 9999sec (0.02sec resolution) or user terminated>20-25A : 0.1 to 180sec (0.02sec resolution) or user terminated>25A : 0.1 to 120sec (0.02sec resolution) or user terminated (50% max duty cycle)GB LeakageDCW or IR test steps : <1µAACW test steps : <5µA per KV setting (DUT isolated), <10µA (DUT grounded)User SettingsCurrent LevelFrequencyMin. Limit (can be disabled)Max. LimitResistance OffsetTest TimeStop/Continue Sequence on FailurePAUSE Test StepsPause Delay0.1 to 9999sec (0.02sec resolution)User SettingsPause DelayHOLD Test StepsTimeout0.1 to 9999sec (0.02sec resolution) or noneUser SettingsTimeout (can be disabled)Message (two lines)SWITCH Test StepsExecution Time<0.05sec per switch (Model V75)<0.04sec per Switch unit + switch unit switching time (see 964 specifications) (All other models)User SettingsSub Type (Model V75)Relay states for each relay in the specified Sub Type (Model V75)Relay states for each relay in each switch unit (4 max switch units) (All other models)Dimensional137mmH x 248mmW x 284mmD (5.4″ x 9.75″ x 11.2″)V70, 71, 73, 75, and 79: 6.8kg (15lb) net, 7.9kg (17.5lb) shippingV74: 7.9kg (17.5lb) net, 9.1kg (20lb) shippingDimensions and weights shown are nominalEnvironmentalStorage Environment-20 to 75C (non-condensing)Operating Environment0 to 40C, <85% RH (non-condensing), Pollution Degree 2Operating Altitude0 to 10000ft ASL, reduced maximum voltage capability above 5000ftPower SourceInternally set for 105-125Vrms or 210-250Vrms, 45-65Hz, 200VA maximumPengukur Elektronik Lainnya

Vitrek V74 5KV AC-DC Hipot Insulation Resistance Ground Bond Tester5KV AC-DC Hipot Insulation Resistance Ground Bond Tester4.3" Color Touch Display-Easy To Use Intuitive User Interface6 Functions to Choose From-AC/DC Hipot, IR, Ground Bond, Continuity and Built-in SwitchingMade in the USA-Designed and Built in San Diego CACompact, Lightweight, Rugged, Fan Free, Fast (100mS min test time) and Accurate5KV AC/DC Hipot, 20mA max source currentGround Bond 1-30A RMS (42 A peak), 100µΩ Resolution100 nano-Amp Leakage Current ResolutionLow Cost of Ownership-Two Year Calibration IntervalUSB 2.0, Serial/RS232, Digital I/O Interfaces are StandardContinuously Variable Insulation Resistance 20-5000V, 450GΩ MaxMulti Mode IR with Steady/Rising Pass ModeTest Memory Stores up to 999 Steps and 60 Test SequencesInternal Self Test Fully Exercises Output and Verifies Current AccuracySpecificationACW Test StepsVoltage10 to 5000Vrms (1V resolution) sinewave at 50 or 60Hz +/- 0.05%Model V75: 10 to 2000Vrms (1V resolution) sinewave at 50 or 60Hz +/- 0.05%1%+5V accuracy under all allowed loading conditionsMax. Load20mArms (10mArms max resistive for >10sec), reduced by 20µA per V below 1000V, reduced by 10µA per V above 4000VLeakage AccuracyDC coupled, true RMS, 10Hz-4KHz 3dB bandwidthDUT isolated (<1.1mA) : 1%+5µA (1µA resolution) DUT isolated (>1.1mA) : 1%+30µA (10µA resolution)DUT grounded : 1%+30µA+(4µA per KV) (10µA resolution)ARC LimitDisabled or up to 30mA (1mA resolution)Ramp0 to 99.9sec (0.02sec resolution)Dwell0.1 to 9999sec (0.1sec resolution) or user terminatedShutdownExcessive HV terminal current : within 1msUser Stop : within 2msInterlock opened (if enabled) : within 2msLoad Breakdown (sudden uncontrolled increase of load current): within 150µsLeakage Limit (if enabled) : within 100msARC Limit (if enabled) : within 1msUser SettingsVoltage LevelFrequencyDUT Isolated/GroundedMin. Leakage Limit (can be disabled)Max. Leakage Limit (can be disabled)ARC Limit (can be disabled)Ramp PeriodDwell PeriodRamp Down Fast/As RampStop/Continue Sequence on FailureDCW Test StepsVoltage20 to 5000VDC (1V resolution)Model V75: 20 to 3000VDC (1V resolution)1%+5V accuracy under all allowed loading conditionsMax. Load2000-3000V : 7mA (reduce by 4µA per volt above 2000V), <0.1µF capacitance3000-4000V : 3mA (reduce by 1µA per volt above 3000V), <0.05µF capacitance >4000V : 2mA (reduce by 0.5µA per volt above 4000V), <0.03µF capacitanceLeakage AccuracyDUT resistive, isolated (<200µA) : 1%+1µA (0.1µA resolution)DUT resistive, isolated (0.2-1.5mA) : 1%+2µA (1µA resolution)Otherwise : 1%+20µA (10µA resolution)ARC LimitDisabled or up to 30mA (1mA resolution)RampDUT resistive : 0.1 to 99.9sec (0.02sec resolution)DUT capacitive : 1.0 to 99.9sec (0.02sec resolution)Dwell0.1 to 9999sec (0.02sec resolution) or user terminatedRamp Down0sec or as defined for rampDischarge Internal50KΩ discharge load and 0.03µF capacitive energyShutdownExcessive HV terminal current : within 1msUser Stop : within 2msInterlock opened (if enabled) : within 2msLoad Breakdown (sudden uncontrolled increase of load current): within 150µsLeakage Limit (if enabled)within 100msARC Limit (if enabled) : within 1msUser SettingsVoltage LevelDUT Isolated/GroundedDUT Resistive/CapacitiveMin. Leakage Limit (can be disabled)Max. Leakage Limit (can be disabled)ARC Limit (can be disabled)Ramp PeriodDwell PeriodRamp Down Fast/As RampStop/Continue Sequence on FailureIR Test StepsVoltage20 to 5000VDC (1V resolution)Model V75: 20 to 3000VDC (1V resolution)2.5%+5V accuracy under all allowed loading conditionsLowest IR3000V : 10MΩHighest IRDUT resistive, isolated : 90MΩ per VDUT capacitive, isolated : 2MΩ per VDUT grounded : 0.1MΩ per VMax Capacitance3000V : 0.03µF5mA maximum charging currentIR Accuracy<5% of Highest IR: 2% (0.1% resolution) 5-15% of Highest IR: 5% (1% resolution) 15-30% of Highest IR: 10% (1% resolution) >30% of Highest IR: 20% (1% resolution)Test Time0.1 to 9999sec (0.1sec resolution) or user terminatedTest Delay0.0 to 9999sec (0.1sec resolution)DischargeInternal 50KΩ discharge load and 0.03µF capacitive energyShutdownExcessive HV terminal current : within 1msUser Stop : within 2msInterlock opened (if enabled) : within 2msLoad Breakdown (sudden uncontrolled increase of load current): within 150µsIR Limit (if enabled) : within 100msARC Limit (if enabled) : within 1msUser SettingsVoltage LevelDUT Isolated/GroundedDUT Resistive/CapacitiveMin. IR LimitMax. IR Limit (can be disabled)Ramp PeriodDwell PeriodDelay PeriodDwell End On Pass/Fail/Time/Steady or RisingRamp Down Fast/As RampStop/Continue Sequence on FailureCONT Test StepsMethod2 terminal measurement (DC)Test Current<10.5mATest Voltage<4.15VRange0Ω to 60KΩAccuracy<0.75Ω : 1.5% + 0.015Ω (0.001Ω resolution)<13Ω : 1.5%+0.02Ω (0.01Ω resolution) 13-1000Ω : 3%+1Ω (1Ω resolution) 1K-4KΩ : 4% (10Ω resolution) 4K-13KΩ : 5% (100Ω resolution) >13KΩ : 10% (1KΩ resolution)Test Time0.06 to 9999sec (0.02sec resolution) or user terminatedCONT LeakageDCW or IR test steps : <0.1µAACW test steps : <2.5µA per KV setting (DUT isolated), <5µA (DUT grounded)User SettingsMin. Limit (can be disabled)Max. Limit (can be disabled)Resistance OffsetTest TimeStop/Continue Sequence on FailureGB Test StepsMethod4 terminal measurement (AC)Current1 to 30Arms (0.01A resolution) sinewave at 50 or 60Hz +/- 0.05%3%+10mA accuracyCompliance>4.5Vrms at all currentsOpen Circuit<10VpkDUT GroundDUT may be isolated from ground or be grounded. If grounded, must be within 3Vpk of V7X ground.RangeMax resistance determined by max compliance and test currentAccuracy6.5A : 2.5%+1mΩ (0.1mΩ resolution)Test Time≤20A : 0.1 to 9999sec (0.02sec resolution) or user terminated>20-25A : 0.1 to 180sec (0.02sec resolution) or user terminated>25A : 0.1 to 120sec (0.02sec resolution) or user terminated (50% max duty cycle)GB LeakageDCW or IR test steps : <1µAACW test steps : <5µA per KV setting (DUT isolated), <10µA (DUT grounded)User SettingsCurrent LevelFrequencyMin. Limit (can be disabled)Max. LimitResistance OffsetTest TimeStop/Continue Sequence on FailurePAUSE Test StepsPause Delay0.1 to 9999sec (0.02sec resolution)User SettingsPause DelayHOLD Test StepsTimeout0.1 to 9999sec (0.02sec resolution) or noneUser SettingsTimeout (can be disabled)Message (two lines)SWITCH Test StepsExecution Time<0.05sec per switch (Model V75)<0.04sec per Switch unit + switch unit switching time (see 964 specifications) (All other models)User SettingsSub Type (Model V75)Relay states for each relay in the specified Sub Type (Model V75)Relay states for each relay in each switch unit (4 max switch units) (All other models)Dimensional137mmH x 248mmW x 284mmD (5.4″ x 9.75″ x 11.2″)V70, 71, 73, 75, and 79: 6.8kg (15lb) net, 7.9kg (17.5lb) shippingV74: 7.9kg (17.5lb) net, 9.1kg (20lb) shippingDimensions and weights shown are nominalEnvironmentalStorage Environment-20 to 75C (non-condensing)Operating Environment0 to 40C, <85% RH (non-condensing), Pollution Degree 2Operating Altitude0 to 10000ft ASL, reduced maximum voltage capability above 5000ftPower SourceInternally set for 105-125Vrms or 210-250Vrms, 45-65Hz, 200VA maximum Pengukur Elektronik Lainnya

Vitrek V73 5KV AC-DC Hipot Insulation Resistance Tester5KV AC-DC Hipot Insulation Resistance Tester4.3" Color Touch Display-Easy To Use Intuitive User InterfaceMade in the USA-Designed and Built in San Diego CA Compact, Lightweight, Rugged, Fan Free, Fast (100mS min test time) and Accurate5KV AC/DC Hipot, 20mA max source current100 nano-Amp Leakage Current ResolutionLow Cost of Ownership-Two Year Calibration IntervalUSB 2.0, Serial/RS232, Digital I/O Interfaces are StandardContinuously Variable Insulation Resistance 20-5000V, 450GΩ MaxMulti Mode IR with Steady/Rising Pass ModeTest Memory Stores up to 999 Steps and 60 Test SequencesInternal Self Test Fully Exercises Output and Verifies Current AccuracyPre-Programmed Daily Verification Test With Optional PVD Test Load150µS Safety ShutdownRamped Discharge CapabilitySPECIFICATION ACW Test StepsVoltage10 to 5000Vrms (1V resolution) sinewave at 50 or 60Hz +/- 0.05%Model V75: 10 to 2000Vrms (1V resolution) sinewave at 50 or 60Hz +/- 0.05%1%+5V accuracy under all allowed loading conditionsMax. Load20mArms (10mArms max resistive for >10sec), reduced by 20µA per V below 1000V, reduced by 10µA per V above 4000VLeakage AccuracyDC coupled, true RMS, 10Hz-4KHz 3dB bandwidthDUT isolated (<1.1mA) : 1%+5µA (1µA resolution) DUT isolated (>1.1mA) : 1%+30µA (10µA resolution)DUT grounded : 1%+30µA+(4µA per KV) (10µA resolution)ARC LimitDisabled or up to 30mA (1mA resolution)Ramp0 to 99.9sec (0.02sec resolution)Dwell0.1 to 9999sec (0.1sec resolution) or user terminatedShutdownExcessive HV terminal current : within 1msUser Stop : within 2msInterlock opened (if enabled) : within 2msLoad Breakdown (sudden uncontrolled increase of load current): within 150µsLeakage Limit (if enabled) : within 100msARC Limit (if enabled) : within 1msUser SettingsVoltage LevelFrequencyDUT Isolated/GroundedMin. Leakage Limit (can be disabled)Max. Leakage Limit (can be disabled)ARC Limit (can be disabled)Ramp PeriodDwell PeriodRamp Down Fast/As RampStop/Continue Sequence on FailureDCW Test StepsVoltage20 to 5000VDC (1V resolution)Model V75: 20 to 3000VDC (1V resolution)1%+5V accuracy under all allowed loading conditionsMax. Load2000-3000V : 7mA (reduce by 4µA per volt above 2000V), <0.1µF capacitance3000-4000V : 3mA (reduce by 1µA per volt above 3000V), <0.05µF capacitance >4000V : 2mA (reduce by 0.5µA per volt above 4000V), <0.03µF capacitanceLeakage AccuracyDUT resistive, isolated (<200µA) : 1%+1µA (0.1µA resolution)DUT resistive, isolated (0.2-1.5mA) : 1%+2µA (1µA resolution)Otherwise : 1%+20µA (10µA resolution)ARC LimitDisabled or up to 30mA (1mA resolution)RampDUT resistive : 0.1 to 99.9sec (0.02sec resolution)DUT capacitive : 1.0 to 99.9sec (0.02sec resolution)Dwell0.1 to 9999sec (0.02sec resolution) or user terminatedRamp Down0sec or as defined for rampDischarge Internal50KΩ discharge load and 0.03µF capacitive energyShutdownExcessive HV terminal current : within 1msUser Stop : within 2msInterlock opened (if enabled) : within 2msLoad Breakdown (sudden uncontrolled increase of load current): within 150µsLeakage Limit (if enabled)within 100msARC Limit (if enabled) : within 1msUser SettingsVoltage LevelDUT Isolated/GroundedDUT Resistive/CapacitiveMin. Leakage Limit (can be disabled)Max. Leakage Limit (can be disabled)ARC Limit (can be disabled)Ramp PeriodDwell PeriodRamp Down Fast/As RampStop/Continue Sequence on FailureIR Test StepsVoltage20 to 5000VDC (1V resolution)Model V75: 20 to 3000VDC (1V resolution)2.5%+5V accuracy under all allowed loading conditionsLowest IR3000V : 10MΩHighest IRDUT resistive, isolated : 90MΩ per VDUT capacitive, isolated : 2MΩ per VDUT grounded : 0.1MΩ per VMax Capacitance3000V : 0.03µF5mA maximum charging currentIR Accuracy<5% of Highest IR: 2% (0.1% resolution) 5-15% of Highest IR: 5% (1% resolution) 15-30% of Highest IR: 10% (1% resolution) >30% of Highest IR: 20% (1% resolution)Test Time0.1 to 9999sec (0.1sec resolution) or user terminatedTest Delay0.0 to 9999sec (0.1sec resolution)DischargeInternal 50KΩ discharge load and 0.03µF capacitive energyShutdownExcessive HV terminal current : within 1msUser Stop : within 2msInterlock opened (if enabled) : within 2msLoad Breakdown (sudden uncontrolled increase of load current): within 150µsIR Limit (if enabled) : within 100msARC Limit (if enabled) : within 1msUser SettingsVoltage LevelDUT Isolated/GroundedDUT Resistive/CapacitiveMin. IR LimitMax. IR Limit (can be disabled)Ramp PeriodDwell PeriodDelay PeriodDwell End On Pass/Fail/Time/Steady or RisingRamp Down Fast/As RampStop/Continue Sequence on FailureCONT Test StepsMethod2 terminal measurement (DC)Test Current<10.5mATest Voltage<4.15VRange0Ω to 60KΩAccuracy<0.75Ω : 1.5% + 0.015Ω (0.001Ω resolution)<13Ω : 1.5%+0.02Ω (0.01Ω resolution) 13-1000Ω : 3%+1Ω (1Ω resolution) 1K-4KΩ : 4% (10Ω resolution) 4K-13KΩ : 5% (100Ω resolution) >13KΩ : 10% (1KΩ resolution)Test Time0.06 to 9999sec (0.02sec resolution) or user terminatedCONT LeakageDCW or IR test steps : <0.1µAACW test steps : <2.5µA per KV setting (DUT isolated), <5µA (DUT grounded)User SettingsMin. Limit (can be disabled)Max. Limit (can be disabled)Resistance OffsetTest TimeStop/Continue Sequence on FailureGB Test StepsMethod4 terminal measurement (AC)Current1 to 30Arms (0.01A resolution) sinewave at 50 or 60Hz +/- 0.05%3%+10mA accuracyCompliance>4.5Vrms at all currentsOpen Circuit<10VpkDUT GroundDUT may be isolated from ground or be grounded. If grounded, must be within 3Vpk of V7X ground.RangeMax resistance determined by max compliance and test currentAccuracy6.5A : 2.5%+1mΩ (0.1mΩ resolution)Test Time≤20A : 0.1 to 9999sec (0.02sec resolution) or user terminated>20-25A : 0.1 to 180sec (0.02sec resolution) or user terminated>25A : 0.1 to 120sec (0.02sec resolution) or user terminated (50% max duty cycle)GB LeakageDCW or IR test steps : <1µAACW test steps : <5µA per KV setting (DUT isolated), <10µA (DUT grounded)User SettingsCurrent LevelFrequencyMin. Limit (can be disabled)Max. LimitResistance OffsetTest TimeStop/Continue Sequence on FailurePAUSE Test StepsPause Delay0.1 to 9999sec (0.02sec resolution)User SettingsPause DelayHOLD Test StepsTimeout0.1 to 9999sec (0.02sec resolution) or noneUser SettingsTimeout (can be disabled)Message (two lines)SWITCH Test StepsExecution Time<0.05sec per switch (Model V75)<0.04sec per Switch unit + switch unit switching time (see 964 specifications) (All other models)User SettingsSub Type (Model V75)Relay states for each relay in the specified Sub Type (Model V75)Relay states for each relay in each switch unit (4 max switch units) (All other models)Dimensional137mmH x 248mmW x 284mmD (5.4″ x 9.75″ x 11.2″)V70, 71, 73, 75, and 79: 6.8kg (15lb) net, 7.9kg (17.5lb) shippingV74: 7.9kg (17.5lb) net, 9.1kg (20lb) shippingDimensions and weights shown are nominalEnvironmentalStorage Environment-20 to 75C (non-condensing)Operating Environment0 to 40C, <85% RH (non-condensing), Pollution Degree 2Operating Altitude0 to 10000ft ASL, reduced maximum voltage capability above 5000ftPower SourceInternally set for 105-125Vrms or 210-250Vrms, 45-65Hz, 200VA maximumPengukur Elektronik Lainnya

Vitrek 981i - 6.5KV Teraohmmeter / Insulation Resistance Tester98x series teraohmmeter / insulation resistance tester6.5 KV DC output voltageMeets today's demanding requirements for higher voltage IR testingIdeal for higher voltage IR requirements, such as electric vehicle systems and higher voltage solar arraysBased on Vitrek's proven DSP technologyCan directly control up to four 64 channel HV scanners, right out of the boxHas a unique combination of performance features - multi dwell functionality, high speed testing, pico-amp leakage measurement, continuously variable IR test voltageBuilt upon the same DSP technology that has established Vitrek as a leader in hipot test systems, the 98xi devices feature a unique combination of performance features including:Multi-dwell Functionality (multiple steps without having to return to zero between steps)High-speed Testing (with dwell times as low as 100 ms)Pico-Amp Leakage Measurement (with stable and precise 50 Teraohm IR readings)Continuously Variable IR Test Voltage (adjustable over the full output range of the instrument)Multi-mode IR (three test modes - end on time, end on pass, end on fail)Capacitance Test Modes (critical for solar panels, cable harnesses and other capacitive loads)General SpecificationsSpecificationsValid after 15 minute warm-up, for 1 year from last external calibration, and for ambient temperature within +/- 2 Degrees C of last performed ZERO operation.EthernetHigh speed, high noise immunity LAN interfaceRS232 InterfaceSelectable baud: 9600, 19200, 38400, 57600 or 115200, full handshakeVICL InterfacesProvided for control of HV ScannersDigital I/O InterfaceProvides 4 digital inputs and 5 digital outputs. Functions include, Start/Stop, Testing, Pass/Fail, HV Present, Safety Interlock, Dwell TimerOptional GPIBOption GPIB-9 adds GPIB interface capabilityOperating Temperature0°C to 50°CHumidity<85% RH (non-condensing)Power105-265Vrms, 45-65Hz, 500VA MaxDimensions89mm H x 432mm W x 457mm D (3.5" H x 17" W x 18" D)Weight5Kg (11 lb.) Net / 7Kg (15 lb.)AccessoriesAlligator test leads, NIST traceable calibration certificate with no data, power cord and operator's manual. Limited ISO 17025 cal cert with data & uncertainties available.DC Output VoltageOutput30V to 6500VAccuracy+/- (0.25% rdg + 0.1V)Output with option HSS230V to 5000VAccuracy with option HSS2+/- (0.25% rdg + 0.1V+1V/mA)Output Resolution1VLoadingup to 4mA charging, 2mA continuousCurrent MeasurementRETURN current only, 1pA to 4mAAccuracy (Resistive Load up to 1000pF)+/- (0.5%rdg + 10pA + 2pA per kV))Accuracy (Capacitive Load 1000pF to 50nF)+/- (0.5%rdg + 100pA + 20pA per kV))Accuracy (Capacitive Load >50nF)+/- (0.5%rdg + 1nA + 200pA per kV))Option HSS2 HV Output current, 1nA to 4mA (for grounded loads)Accuracy (Resistive Load up to 1000pF), C<1000pF)+/- (0.5%rdg + 5nA + 1nA per kV))Accuracy (Capacitive Load 1000pF to 50nF)+/- (0.5%rdg + 7.5nA + 2.5nA per kV))Accuracy (Capacitive Load >50nF)+/- (0.5%rdg + 10nA + 5nA per kV))TimingCharge Time1 second minimum charge time, 9999 sec max.Dwell Time0.1s to 9999 days, 0.1 sec resolutionMultimeter

Vitrek 4700 Precision High Voltage MeterCalibrates Hipot Testers, HV Power Supplies and Insulation TestersBasic Accuracy - 0.03% DC and 0.1% True RMS ACColor Touch Screen - Makes for Easy Measurement Selection and DisplayPC Connectivity with standard Ethernet, Serial, USB Printer Port and optional GPIBChart Mode Stores 300 Readings to Document HV source drift, ramp time, overshoot and sagDual inputs provide Differential or Phase to Phase Voltage MeasurementHigh Speed DSP provides up to 60 filtered readings per secondTrue RMS AC Measurement from 0.01Hz to 600Hz - Covering VLF to Aviation FrequenciesAC Noise Rejection 78dB - For Rock Solid, 6 Digit DC MeasurementsOptional Lithium-ion Battery Pack goes up to 11 hours between chargesCE mark Certified to EN61010Three Year Extended Warranty4700 Direct Input MeasurementMaximum Input Voltage10KV DC, 10KV AC RMS, 15KV peak (110MO input impedance)DC Voltage Accuracy0.03% of reading + 0.03V + ½ digitAC Voltage Accuracy (True RMS, Band Selectable)0.01 to 1Hz : 0.12% of reading + 0.1V + ½ digit10 to 65Hz : 0.12% of reading + 0.1V + ½ digit30 to 200Hz : 0.12% of reading + 0.1V + ½ digit200 to 450Hz : 0.4% of reading + 0.1V + ½ digit4700 HV-SmartProbe™ Input MeasurementMaximum Input VoltagesHVL & HVP 35KV Probes 35KVDC, 30KV AC RMS, 42.5KV peak (200MΩ input impedance)HVL & HVP-70KV Probes 70KVDC, 50KV AC RMS, 71KV peak (400MΩ input impedance)HVL-100 Probe 100KVDC, 70KV AC RMS, 100KV peak (600MΩ input impedance)DC Voltage AccuracyHVL-35: 0.025% of reading + 0.07V + ½ digitHVP-35: 0.035% of reading + 0.07V + ½ digitHVL-70: 0.03% of reading + 0.2V + ½ digitHVP-70: 0.04% of reading + 0.2V + ½ digitHVL-100: 0.05% of reading + 0.3V + ½ digitAC Voltage Accuracy (True RMS, Band Selectable)HVL/P-35 0.01 to 1Hz : 0.15% of reading + 0.2V + ½ digitHVL-35 30 to 200Hz : 0.05% of reading + 0.2V + ½ digit*HVP-35 30 to 200Hz : 0.1% of reading + 0.2V + ½ digitHVL/P-35 200 to 450Hz : 0.6% of reading + 0.2V + ½ digit*measurement accuracy within ± 10Hz of calibration frequencyGeneral SpecificationsAC/DC Voltage Measurement ResolutionDisplayed Resolution:Selectable 4, 5 or 6 digitsDirect Input.01V to 1400Vpk 0.1V to 14KVpk 1V above 14KVpk35KV Probes .01 to 800Vpk 0.1V to 8KVpk 1V above 8KVpk70KV Probes .01V to 1.6KVpk 0.1 V to 16KVpk 1V above 16KVpk100KV Probe .01V to 2.4KVpk 0.1V to 24KVpk 1V above 24KVpkEnvironmental/ PhysicalOperating Environment0 to 50C, <85% RH (non-condensing)Dimensions218mm (8.5") wide x 130mm (5") high x 253mm (10")deep, nominallyWeight2.4kg max (4kg shipping)PowerAC Source45 to 450Hz, 100 to 265Vrms at <15W (20VA) using supplied external power supplyDC Source11 to 16Vdc at <1.2A, using a center positive 2.5mm DC power connectorBP-47 Battery OptionUp to 11hrs continuous operation from fully chargedStandard AccessoriesThe 4700 is shipped with a NIST traceable certificate of calibration with data, direct input test leads, chassis ground lead, and external power supply. The HVP series handheld probes ship with a detachable probe tip and the HVL series probes ship with external power supply.Warranty3 year extended parts and labor warranty with no charge registration and annual factory calibration. 1 year standard warranty.Voltmeter